GENEVA, May 27 -- LINTEC CORPORATION (23-23, Honcho, Itabashi-ku, Tokyo1730001), リンテック株式会社 (東京都板橋区本町２３番２３号) filed a patent application (PCT/JP2024/040528) for "MICRONEEDLE PATCH AND ANALYSIS METHOD" on Nov 14, 2024. With publication no. WO/2025/105446, the details related to the patent application was published on May 22, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): KOMA Yosuke (c/o LINTEC CORPORATION, 23-23, Honcho, Itabashi-ku, ...