GENEVA, Oct. 26 -- LEICA MICROSYSTEMS CMS GMBH (Ernst-Leitz-StraBe 17 - 3735578 Wetzlar) filed a patent application (PCT/EP2024/060273) for "ANALYSIS SYSTEM AND METHOD FOR ANALYSING CAPTURE CONSTRUCTS" on Apr 16, 2024. With publication no. WO/2025/218883, the details related to the patent application was published on Oct 23, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): ALSHEIMER, Soeren (Ernst-Leitz-StraBe 17 - 3735578 Wetzlar)
Abstract: An analysis system (1300, 1400, 1500) for analysing capture constructs (100, 1000, 1302) is provided. The analysis system (1300, 1400, 1500) comprises a...