INTERNATIONAL PATENT: LEIA INC. FILES APPLICATION FOR "CALIBRATION TECHNIQUES USING PATTERNED TARGETS AND CAMERAS"

GENEVA, Nov. 25 -- LEIA INC. (Intellectual Property Department2440 Sand Hill Road, Ste 200Menlo Park, California 94025) filed a patent application (PCT/US2025/029074) for "CALIBRATION TECHNIQUES USING PATTERNED TARGETS AND CAMERAS" on May 13, 2025. With publication no. WO/2025/240427, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): FATTAL, David A. (216 Shumway LaneMountain View, California 94041), CAARLS, Jurjen (Eschweilerhof 45, NL5625 NN Eindhoven), DE JONG, Pieter Wilhelmus Theodorus (Eerste Herven 75232 JM's Hertoge...