INTERNATIONAL PATENT: LEENO INDUSTRIAL INC. FILES APPLICATION FOR "TEST PROBE AND TEST DEVICE"

GENEVA, June 3 -- LEENO INDUSTRIAL INC. (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748) filed a patent application (PCT/KR2024/018405) for "TEST PROBE AND TEST DEVICE" on Nov 20, 2024. With publication no. WO/2025/110716, the details related to the patent application was published on May 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SHIN, Youngtaek (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748), UHM, Heeil (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748)

Abstract: Disclosed is a test probe for testing the electrical characteristics of a subject-to-be-tested. ...