INTERNATIONAL PATENT: LEENO INDUSTRIAL INC. FILES APPLICATION FOR "TEST PROBE AND METHOD OF MANUFACTURING THE SAME"

GENEVA, June 11 -- LEENO INDUSTRIAL INC. (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748) filed a patent application (PCT/KR2024/018413) for "TEST PROBE AND METHOD OF MANUFACTURING THE SAME" on Nov 20, 2024. With publication no. WO/2025/116406, the details related to the patent application was published on Jun 05, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BAEK, Seungha (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748)

Abstract: Disclosed is a test probe. The test probe includes a barrel shaped like a barrel; and a terminal including a terminal body portion partially ins...