INTERNATIONAL PATENT: LEENO INDUSTRIAL INC. FILES APPLICATION FOR "TEST PROBE AND METHOD OF MANUFACTURING THE SAME"

GENEVA, May 6 -- LEENO INDUSTRIAL INC. (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748) filed a patent application (PCT/KR2024/016176) for "TEST PROBE AND METHOD OF MANUFACTURING THE SAME" on Oct 23, 2024. With publication no. WO/2025/089786, the details related to the patent application was published on May 01, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BAEK, Seungha (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748)

Abstract: Disclosed is a method of manufacturing a test probe. The method includes: forming a terminal body portion by stacking a lower dry film on a substr...