INTERNATIONAL PATENT: LEE, NA HYUN, 이나현 FILES APPLICATION FOR "TEST MANAGEMENT SYSTEM FOR PROVIDING DASHBOARD"

GENEVA, Jan. 27 -- LEE, Na Hyun (202ho, 116, Byeongmogan-ro 130beon-gil,Manan-gu, Anyang-siGyeonggi-do 14019), 이나현 (경기도안양시 만안구병목안로130번길 116, 202호) filed a patent application (PCT/KR2025/010528) for "TEST MANAGEMENT SYSTEM FOR PROVIDING DASHBOARD" on Jul 17, 2025. With publication no. WO/2026/019274, the details related to the patent application was published on Jan 22, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LEE, Na Hyun (202ho, 116, Byeongmogan-ro 130b...