INTERNATIONAL PATENT: LANDMARK GRAPHICS CORPORATION FILES APPLICATION FOR "SYSTEM FOR PROBABILISTICALLY DETERMINING SHALE SMEAR OCCURRENCE FOR FAULT SEAL ANALYSIS"

GENEVA, May 27 -- LANDMARK GRAPHICS CORPORATION (3000 N. Sam Houston Pkwy E.Houston, Texas 77032-3219) filed a patent application (PCT/US2023/079717) for "SYSTEM FOR PROBABILISTICALLY DETERMINING SHALE SMEAR OCCURRENCE FOR FAULT SEAL ANALYSIS" on Nov 14, 2023. With publication no. WO/2025/106067, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WROBEL-DAVEAU, Jean-Christophe (97 Jubilee Ave, Milton ParkAbingdon OX14 4RW), DAVIES, Andrew (97 Jubilee Ave, Milton ParkAbingdon OX14 4RW), BAINES, Graham (97 Jubilee Ave, Milton ...