INTERNATIONAL PATENT: KONINKLIJKE PHILIPS N.V. FILES APPLICATION FOR "X-RAY IMAGING WITH STEEPER VIEWING ANGLES"

GENEVA, March 9 -- KONINKLIJKE PHILIPS N.V. (High Tech Campus 525656 AG Eindhoven) filed a patent application (PCT/EP2024/073780) for "X-RAY IMAGING WITH STEEPER VIEWING ANGLES" on Aug 26, 2024. With publication no. WO/2025/045800, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DRIES, Johan Juliana (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525656 AG Eindhoven), VAN DER WACHT, JantjeRogier Sean (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525...