INTERNATIONAL PATENT: KONINKLIJKE PHILIPS N.V. FILES APPLICATION FOR "X-RAY IMAGING WITH IN-LINE CALIBRATION"

GENEVA, June 2 -- KONINKLIJKE PHILIPS N.V. (High Tech Campus 525656 AG Eindhoven) filed a patent application (PCT/EP2024/082768) for "X-RAY IMAGING WITH IN-LINE CALIBRATION" on Nov 19, 2024. With publication no. WO/2025/108908, the details related to the patent application was published on May 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ELENBAAS, Thijs (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525656 AG Eindhoven), VAN DER WACHT, Rogier Sean (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525656 AG Eindhove...