INTERNATIONAL PATENT: KONINKLIJKE PHILIPS N.V. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR OPTIMIZATION OF COMPONENT LIFETIME IN BALANCE WITH IMAGE QUALITY BY MEASURING DEVICE WEAR"

GENEVA, June 2 -- KONINKLIJKE PHILIPS N.V. (High Tech Campus 525656 AG Eindhoven) filed a patent application (PCT/EP2024/082090) for "SYSTEMS AND METHODS FOR OPTIMIZATION OF COMPONENT LIFETIME IN BALANCE WITH IMAGE QUALITY BY MEASURING DEVICE WEAR" on Nov 13, 2024. With publication no. WO/2025/108785, the details related to the patent application was published on May 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PRONK, Serverius Petrus Paulus (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525656 AG Eindhoven), VOGTMEIER, Gereon (c/o Philips Internat...