GENEVA, Dec. 22 -- KONINKLIJKE PHILIPS N.V. (High Tech Campus 525656 AG Eindhoven) filed a patent application (PCT/EP2025/065256) for "METHOD AND SYSTEM FOR DEPTH ESTIMATION" on Jun 03, 2025. With publication no. WO/2025/256951, the details related to the patent application was published on Dec 18, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): VAN GEEST, Bartholomeus Wilhelmus Damianus (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525656 AG Eindhoven)
Abstract: A system and method for depth estimation. Segmentation is performed on a set of 2D images o...