INTERNATIONAL PATENT: KONICA MINOLTA, INC., コニカミノルタ株式会社 FILES APPLICATION FOR "OPTICAL CHARACTERISTIC MEASURING DEVICE, OPTICAL CHARACTERISTIC MEASURING SYSTEM, OPTICAL CHARACTERISTIC MEASURING METHOD AND PROGRAM"

GENEVA, July 8 -- KONICA MINOLTA, INC. (2-7-2, Marunouchi, Chiyoda-ku, Tokyo1007015), コニカミノルタ株式会社 (東京都千代田区丸の内二丁目７番２号) filed a patent application (PCT/JP2024/041621) for "OPTICAL CHARACTERISTIC MEASURING DEVICE, OPTICAL CHARACTERISTIC MEASURING SYSTEM, OPTICAL CHARACTERISTIC MEASURING METHOD, AND PROGRAM" on Nov 25, 2024. With publication no. WO/2025/142250, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is m...