GENEVA, May 19 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2024/054831) for "TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTI-PASS SPECTROSCOPIC ELLIPSOMETRY AND RAMAN JOINT MEASUREMENT" on Nov 07, 2024. With publication no. WO/2025/101683, the details related to the patent application was published on May 15, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHOUAIB, Houssam (2112 Mesa Verde DriveMilpitas, California 95035), TAN, Zhengquan (20306 Clifden WayCupertino, California 95014), SUBEDI, Shova (3507 Palmilla Drive #3...