INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "SYSTEM AND METHOD OF FINDING PIXEL-TO-DESIGN TARGET FOR DRAM INSPECTION"

GENEVA, June 19 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2024/058560) for "SYSTEM AND METHOD OF FINDING PIXEL-TO-DESIGN TARGET FOR DRAM INSPECTION" on Dec 05, 2024. With publication no. WO/2025/122680, the details related to the patent application was published on Jun 12, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JIANG, Jun (313 Chauncey CircleChapel Hill, North Carolina 27516), LEE, Kelvin (Tzu-Kuei) (No. 169, Ln. 111, Sec. 1, Binhai Rd.Tamsui Dist.Taipei, 24906), JIN, Huan (2218 Forino DriveDublin, California 94568), LEE, H...