INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "SYSTEM AND METHOD FOR DEFECT DETECTION USING A CONDITIONAL MASKED AUTOENCODER"

GENEVA, Nov. 25 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/025501) for "SYSTEM AND METHOD FOR DEFECT DETECTION USING A CONDITIONAL MASKED AUTOENCODER" on Apr 21, 2025. With publication no. WO/2025/240077, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WATRAS, Alex (264 Jessie Ln. Unit AMountain View, California 94041), FANG, Hawren (15297 Stratford DriveSan Jose, California 95124), JIN, Huan (2218 Forino DriveDublin, California 94568), RAVANFAR, Mohammadreza...