INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "SAMPLE INSPECTION WITH MULTIPLE MEASUREMENT MODES"

GENEVA, Sept. 2 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/016332) for "SAMPLE INSPECTION WITH MULTIPLE MEASUREMENT MODES" on Feb 18, 2025. With publication no. WO/2025/178879, the details related to the patent application was published on Aug 28, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ZHAO, Guoheng (408 Pratt LanePalo Alto, California 94306), WHITESIDE, Bret (3048 Valley of Hearts Delight PlaceSan Jose, California 95136), KAVALDJIEV, Daniel (5645 Begonia DriveSan Jose, California 95124), XU, Zhiwei (1780 Laurentian WyS...