INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "MULTI-THICKNESS OVERLAY MEASUREMENT SYSTEM"

GENEVA, April 30 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2024/049356) for "MULTI-THICKNESS OVERLAY MEASUREMENT SYSTEM" on Oct 01, 2024. With publication no. WO/2025/085238, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HAZZOT, Amiram (Hagilboa 2213191 Moledet), BITON, Yakir (HaDekel 41932300 Achuzat Barak), HAR-ZVI, Michael (11 Barazani St.6329302 Tel-Aviv), GRUMAN, Hen (Klil Hachoresh 26083705 Rakafet), WISEMAN, Asaf (Kibbutz Hanita2288500 Kibbutz Hanita), R...