INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "METROLOGY WITH PARALLEL SUBSYSTEMS AND MUELLER SIGNALS TRAINING"

GENEVA, Aug. 19 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/013475) for "METROLOGY WITH PARALLEL SUBSYSTEMS AND MUELLER SIGNALS TRAINING" on Jan 29, 2025. With publication no. WO/2025/170798, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHOUAIB, Houssam (1195 Piedmont Rd.San Jose, California 95132)

Abstract: A metrology system may receive two or more measurement datasets associated with a test feature on a sample from one or more measurement sub-systems ...