INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "METHOD AND SYSTEM FOR AUTOMATIC RETRAINING OF MACHINE LEARNING MODELS FOR METROLOGY METRIC ESTIMATION"

GENEVA, Sept. 17 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/018240) for "METHOD AND SYSTEM FOR AUTOMATIC RETRAINING OF MACHINE LEARNING MODELS FOR METROLOGY METRIC ESTIMATION" on Mar 04, 2025. With publication no. WO/2025/188683, the details related to the patent application was published on Sep 11, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GRECHIN, Sveta (HaLavyan 12353401 Migdal HaEmek), SHUSTERMAN, Udi (Ramat David36587 Ramat Rachel), OPHIR, Boaz (Shderot Itzhak 73448207 Haifa)

Abstract: A metrology method with autom...