INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "MEASUREMENT CONDITION DEPENDENT, MULTI-DIMENSIONAL MODEL OF OPTICAL DISPERSION OF SEMICONDUCTOR STRUCTURES"

GENEVA, Nov. 18 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/025505) for "MEASUREMENT CONDITION DEPENDENT, MULTI-DIMENSIONAL MODEL OF OPTICAL DISPERSION OF SEMICONDUCTOR STRUCTURES" on Apr 21, 2025. With publication no. WO/2025/235185, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HU, Dawei (1753 Hazelnut LaneMilpitas, California 95035), ZHANG, Tianhao (1032 Coronado WayLivermore, California 94550), DI, Ming (4095 W. Las Positas Blvd.Pleasanton, California 94...