INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "IMAGE MODELING-ASSISTED METROLOGY"

GENEVA, Sept. 3 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/016687) for "IMAGE MODELING-ASSISTED METROLOGY" on Feb 21, 2025. With publication no. WO/2025/179082, the details related to the patent application was published on Aug 28, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): EYRING, Stefan (Freystaedter Strasse 535781 Weilburg), MICHELSSON, Detlef (Taunusstrasse 2835792 Lohnberg), JAVADI, Mahrokh (Jacksburg Strasse 435578 Wetzlar), LUU, Van-Thin (Heidenstock 15a35578 Wetzlar), CZERKAS, Slawomir (Untertaunusstrasse 335781 Wei...