INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "HIGH CONTRAST IMAGING IN BONDED SAMPLE METROLOGY USING OBLIQUE ILLUMINATION"

GENEVA, Oct. 6 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/021214) for "HIGH CONTRAST IMAGING IN BONDED SAMPLE METROLOGY USING OBLIQUE ILLUMINATION" on Mar 25, 2025. With publication no. WO/2025/207548, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): EISENBACH, Shlomo (Torah veAvoda 343792000 Kfar Pines), GRAUER, Yoav (Golda Meir 273498229 Haifa), PENIA, Motti (75 Emek Hashalom St.2069316 Yokneam), HILL, Andrew V. (57399 Lake Aspen LnSunriver, Oregon 97707), S...