INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "FLEXIBLE MEASUREMENT MODELS FOR MODEL BASED MEASUREMENTS OF SEMICONDUCTOR STRUCTURES"

GENEVA, Feb. 18 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2024/039074) for "FLEXIBLE MEASUREMENT MODELS FOR MODEL BASED MEASUREMENTS OF SEMICONDUCTOR STRUCTURES" on Jul 23, 2024. With publication no. WO/2025/034393, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHOUAIB, Houssam (2112 Mesa Verde DriveMilpitas, California 95035), ZHAN, Tianrong (No 79-80, Lane 887 Zuchongzhi RdShanghai 201203), ILORETA, Jonathan (1016 Florence Lane, Apt. 3Menlo Park, California 9...