INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "DEFECT SYNTHESIS AND DETECTION VIA DEFECT GENERATIVE PRE-TRAINED TRANSFORMER FOR SEMICONDUCTOR APPLICATIONS"

GENEVA, April 21 -- KLA CORPORATION (One Technology DriveMilpitas, CA 95035) filed a patent application (PCT/US2024/049350) for "DEFECT SYNTHESIS AND DETECTION VIA DEFECT GENERATIVE PRE-TRAINED TRANSFORMER FOR SEMICONDUCTOR APPLICATIONS" on Oct 01, 2024. With publication no. WO/2025/080459, the details related to the patent application was published on Apr 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ZHANG, Jing (510 Mansion CourtSanta Clara, CA 95054), LI, Yang (190 Ryland St.Apt. 1403San Jose, CA 95110), DONG, Yujie (35322 Dover CourtNewark, CA 94560), ZHANG, Xiu (460 Bayview Ave.Mi...