INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "COMBINING DEEP LEARNING MODEL HIDDEN LAYER OUTPUT WITH SPECIMEN-SPECIFIC INPUT FOR DEFECT CLASSIFICATION OR ANOTHER SEMICONDUCTOR APPLICATION"

GENEVA, Nov. 4 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/023772) for "COMBINING DEEP LEARNING MODEL HIDDEN LAYER OUTPUT WITH SPECIMEN-SPECIFIC INPUT FOR DEFECT CLASSIFICATION OR ANOTHER SEMICONDUCTOR APPLICATION" on Apr 09, 2025. With publication no. WO/2025/226447, the details related to the patent application was published on Oct 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KIRKWOOD, Jason (950 High School Way #3237Mountain View, California 94041), LAUBER, Jan (208 Galewood CircleSan Francisco, California 94131)

Abstr...