GENEVA, March 25 -- KIM, Yong Hoon (706-105, 152 Gangseok-roIlsandong-gu, Goyang-si,Gyeonggi-do 10415), 김용훈 (경기도고양시 일산동구강석로 152, 706동 105호) filed a patent application (PCT/KR2024/013352) for "PHOTOMASK INSPECTION DEVICE, AND INSPECTION METHOD THEREOF" on Sep 04, 2024. With publication no. WO/2025/058319, the details related to the patent application was published on Mar 20, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): KIM, Yong Hoon (706-105, 152 Gangseok-roIlsando...