INTERNATIONAL PATENT: KABUSHIKI KAISHA TOSHIBA FILES APPLICATION FOR "METHOD AND ASSAY KIT FOR DETECTING SINGLE BASE SUBSTITUTION IN GROUP OF SHORT-CHAIN RNAS HAVING SEQUENCE DIVERSITY ON 3' SIDE"

GENEVA, Dec. 30 -- KABUSHIKI KAISHA TOSHIBA (1-1, Shibaura 1-chome, Minato-ku, Tokyo1050023) filed a patent application (PCT/JP2025/006888) for "METHOD AND ASSAY KIT FOR DETECTING SINGLE BASE SUBSTITUTION IN GROUP OF SHORT-CHAIN RNAS HAVING SEQUENCE DIVERSITY ON 3' SIDE" on Feb 27, 2025. With publication no. WO/2025/263020, the details related to the patent application was published on Dec 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TAGE, Hiroki (c/o Toshiba Corp. (K. K. TOSHIBA), 1-1, Shibaura 1-chome, Minato-ku, Tokyo1050023), AKAHOSHI, Eiichi (c/o Toshiba Corp. (K. K. TOSHIBA), 1-...