INTERNATIONAL PATENT: JIO PLATFORMS LIMITED FILES APPLICATION FOR "SYSTEM AND METHOD FOR ANALYZING COMPLEX PERFORMANCE METRICS"

GENEVA, Feb. 3 -- JIO PLATFORMS LIMITED (Office-101, Saffron, Nr. Centre Point, Panchwati 5 Rasta, Ambawadi,Ahmedabad, Gujarat 380006) filed a patent application (PCT/IN2024/051023) for "SYSTEM AND METHOD FOR ANALYZING COMPLEX PERFORMANCE METRICS" on Jul 02, 2024. With publication no. WO/2025/022420, the details related to the patent application was published on Jan 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BHATNAGAR, Aayush (Tower-7, 15B, Beverly Park, Sector 14, Koper Khairne,Navi Mumbai, Maharashtra 400709), MURARKA, Ankit (W-16, F-1603, Lodha Amara, Kolshet Road,Thane West, Mah...