INTERNATIONAL PATENT: JENTEK SENSORS INC. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR IN-SITU SENSING AND DATA ANALYSIS FOR INDUSTRIAL PROCESSES"

GENEVA, Oct. 20 -- JENTEK SENSORS INC. (121 Bartlett StreetMarlborough, Massachusetts 01752) filed a patent application (PCT/US2025/024420) for "SYSTEMS AND METHODS FOR IN-SITU SENSING AND DATA ANALYSIS FOR INDUSTRIAL PROCESSES" on Apr 11, 2025. With publication no. WO/2025/217613, the details related to the patent application was published on Oct 16, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GOLDFINE, Neil (121 Bartlett StreetMarlborough, Massachusetts 01752), WASHABAUGH, Andrew (121 Bartlett StreetMarlborough, Massachusetts 01782), WINDOLOSKI, Mark (121 Bartlett StreetMarlborough, Ma...