INTERNATIONAL PATENT: JENTEK SENSORS INC. FILES APPLICATION FOR "HOLE INSPECTION SCANNER SYSTEM AND METHOD OF USE"

GENEVA, July 21 -- JENTEK SENSORS INC. (121 Bartlett StreetMarlborough, Massachusetts 01752) filed a patent application (PCT/US2024/055271) for "HOLE INSPECTION SCANNER SYSTEM AND METHOD OF USE" on Nov 08, 2024. With publication no. WO/2025/151187, the details related to the patent application was published on Jul 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHAPLAN, Stuart (121 Bartlett StreetMarlborough, Massachusetts 01752), GOLDFINE, Neil (121 Bartlett StreetMarlborough, Massachusetts 01752), WINDOLOSKI, Mark (121 Bartlett StreetMarlborough, Massachusetts 01752), WASHABAUGH, Andre...