INTERNATIONAL PATENT: JEIO TECH CO., LTD., 주식회사 제이오텍 FILES APPLICATION FOR "MULTI-SAMPLE TEST SYSTEM FOR INCREASING UTILIZATION OF LABORATORY CHAMBER EQUIPMENT"

GENEVA, July 3 -- JEIO TECH CO., LTD. (153, Techno 2-roYuseong-guDaejeon 34025), 주식회사 제이오텍 (대전광역시유성구테크노2로 153) filed a patent application (PCT/KR2024/007231) for "MULTI-SAMPLE TEST SYSTEM FOR INCREASING UTILIZATION OF LABORATORY CHAMBER EQUIPMENT" on May 28, 2024. With publication no. WO/2025/135332, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KIM, Gi Sung (1108dong 604ho, 114, Ba...