INTERNATIONAL PATENT: JAY PHOTONICS INC. FILES APPLICATION FOR "METHOD FOR IMAGING A SUBSTRATE OF A SEMICONDUCTOR MATERIAL AND INFRARED MICROSCOPY SYSTEMS THEREFORE"

GENEVA, Dec. 28 -- JAY PHOTONICS INC. (633 av. des Oblats,Quebec, Quebec G1N 1W1) filed a patent application (PCT/CA2025/050783) for "METHOD FOR IMAGING A SUBSTRATE OF A SEMICONDUCTOR MATERIAL AND INFRARED MICROSCOPY SYSTEMS THEREFORE" on Jun 05, 2025. With publication no. WO/2025/260173, the details related to the patent application was published on Dec 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LAPOINTE, Jerome (633 av. des Oblats,Quebec, Quebec G1N 1W1)

Abstract: There is described an infrared microscopy system for imaging a substrate of a semiconductor material having an optica...