GENEVA, Oct. 19 -- J&L TECH CO., LTD. (152 Byeolmang-roDanwon-gu, Ansan-si,Gyeonggi-do 15618), (주)제이 앤 엘 테크 (경기도안산시 단원구별망로 152) filed a patent application (PCT/KR2025/002559) for "DEFECT DETECTION DEVICE AND DEFECT DETECTION ASSEMBLY" on Feb 24, 2025. With publication no. WO/2025/216428, the details related to the patent application was published on Oct 16, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): SONG, Sang Jun (706-1002, 163 Eco jungang-roNamdong-gu,In...