INTERNATIONAL PATENT: INTEL CORPORATION FILES APPLICATION FOR "METHODS, SYSTEMS, ARTICLES OF MANUFACTURE AND APPARATUS FOR IMPROVED THERMAL TESTS OF INTEGRATED CIRCUIT DEVICES"

GENEVA, April 8 -- INTEL CORPORATION (2200 Mission BoulevardSanta Clara, California 95054) filed a patent application (PCT/US2024/042761) for "METHODS, SYSTEMS, ARTICLES OF MANUFACTURE, AND APPARATUS FOR IMPROVED THERMAL TESTS OF INTEGRATED CIRCUIT DEVICES" on Aug 16, 2024. With publication no. WO/2025/071802, the details related to the patent application was published on Apr 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MURTAGIAN, Gregorio R. (15006 S 5th AvenuePhoenix, Arizona 85045)

Abstract: Systems, apparatus, articles of manufacture, and methods are disclosed that improve ther...