INTERNATIONAL PATENT: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES, 中国科学院微电子研究所 FILES APPLICATION FOR "IMAGE FEATURE EXTRACTION METHOD AND APPARATUS BASED ON MAGNETIC TUNNEL JUNCTION ARRAY"

GENEVA, March 8 -- INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES (3 Beitucheng West RoadChaoyang District, Beijing 100029), 中国科学院微电子研究所 (中国北京市朝阳区北土城西路3号) filed a patent application (PCT/CN2023/116007) for "IMAGE FEATURE EXTRACTION METHOD AND APPARATUS BASED ON MAGNETIC TUNNEL JUNCTION ARRAY" on Aug 31, 2023. With publication no. WO/2025/043577, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World I...