INTERNATIONAL PATENT: INFICON, INC. FILES APPLICATION FOR "A METHOD AND SYSTEM FOR MONITORING A DEGAS CHAMBER USING A PHOTOIONIZATION DETECTOR AND A RESIDUAL GAS ANALYZER"

GENEVA, April 21 -- INFICON, INC. (Two Technology PlaceEast Syracuse, NY 13057) filed a patent application (PCT/US2024/050498) for "A METHOD AND SYSTEM FOR MONITORING A DEGAS CHAMBER USING A PHOTOIONIZATION DETECTOR AND A RESIDUAL GAS ANALYZER" on Oct 09, 2024. With publication no. WO/2025/080660, the details related to the patent application was published on Apr 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VOLLERO, Michael F. (4459 Swissvale DriveManlius, NY 13104), BRIGLIN, Shawn M. (3939 Pompey Hollow RoadCazenovia, NY 13035), GRAFF, Nathan (4427 Silkweed CircleManlius, NY 13104), ...