INTERNATIONAL PATENT: ILLUMINA, INC. FILES APPLICATION FOR "QUALITY CONTROL METRICS FOR METHYLATION ASSAYS"

GENEVA, Nov. 11 -- ILLUMINA, INC. (5200 Illumina WaySan Diego, California 92122) filed a patent application (PCT/US2025/026838) for "QUALITY CONTROL METRICS FOR METHYLATION ASSAYS" on Apr 29, 2025. With publication no. WO/2025/231002, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ZOU, Jennifer (5200 Illumina WaySan Diego, California 92122), LI, Yong (5200 Illumina WaySan Diego, California 92122)

Abstract: The presently described techniques utilize detection p-value metrics as part of determining sample quality in the c...