INTERNATIONAL PATENT: IDEMIA FRANCE FILES APPLICATION FOR "DEVICE FOR TESTING A PLURALITY OF INTEGRATED CIRCUITS ON A SEMICONDUCTOR WAFER"

GENEVA, April 28 -- IDEMIA FRANCE (2 Place Samuel de Champlain92400 Courbevoie) filed a patent application (PCT/EP2024/079067) for "DEVICE FOR TESTING A PLURALITY OF INTEGRATED CIRCUITS ON A SEMICONDUCTOR WAFER" on Oct 15, 2024. With publication no. WO/2025/082986, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BASTIEN, Christophe (c/o IDEMIA FRANCEService IP IST2, place Samuel de Champlain92400 Courbevoie), AG MOHAMED, Mohamedoun (c/o IDEMIA FRANCEService IP IST2, place Samuel de Champlain92400 Courbevoie), VAUTRIN, Tho...