INTERNATIONAL PATENT: ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH, TECHNISCHE UNIVERSITEIT DELFT FILES APPLICATION FOR "OPTICAL SYSTEM FOR A PLURALITY OF PRIMARY BEAMLETS, CHARGED PARTICLE MULTI-BEAM APPARATUS AND METHOD OF FOCUSING A PLURALITY OF PRIMARY BEAMLETS"

GENEVA, June 23 -- ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH (Ammerthalstr. 2085551 Heimstetten), TECHNISCHE UNIVERSITEIT DELFT (Stevinweg 12628 CN Delft) filed a patent application (PCT/EP2024/085606) for "OPTICAL SYSTEM FOR A PLURALITY OF PRIMARY BEAMLETS, CHARGED PARTICLE MULTI-BEAM APPARATUS AND METHOD OF FOCUSING A PLURALITY OF PRIMARY BEAMLETS" on Dec 11, 2024. With publication no. WO/2025/125289, the details related to the patent application was published on Jun 19, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KRUIT, Pieter (Koornmarkt 492611EB Delft...