GENEVA, July 1 -- ICEYE OY (Maarintie 602150 Espoo) filed a patent application (PCT/EP2024/087457) for "IDENTIFYING STRUCTURE DAMAGE USING SYNTHETIC APERTURE RADAR" on Dec 19, 2024. With publication no. WO/2025/132827, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): MAINVIS, Aymeric (Maarintie 602150 Espoo), CARDENAL, Roberto Llop (Maarintie 602150 Espoo)
Abstract:
A method of classifying a structure as a damaged structure using synthetic aperture radar data from one or more space-borne satellites, the method comprisin...