GENEVA, Nov. 3 -- ICEYE OY (Maarintie 602150 Espoo) filed a patent application (PCT/EP2025/060845) for "HIGH RESOLUTION WIDE SWATH SAR IMAGING USING WAVEFORM DIVERSITY" on Apr 22, 2025. With publication no. WO/2025/224049, the details related to the patent application was published on Oct 30, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): DOĞAN, Ozan (c/o ICEYE OyMaarintie 602150 Espoo)
Abstract: Methods, systems, and techniques for processing synthetic aperture radar ("SAR") echo data in order to increase swath width. Data representing echoes of a transmitted series of radar pulses i...