GENEVA, July 18 -- HYLID DIAGNOSTICS INC (2487 Kaladar Avenue, Suite 209Ottawa, Ontario K1V 8B9) filed a patent application (PCT/CA2025/050042) for "SYSTEM AND METHOD OF PLASMA SEPARATION AND MEASUREMENT IN POINT-OF-CARE DIAGNOSTIC CARTRIDGES" on Jan 12, 2025. With publication no. WO/2025/147782, the details related to the patent application was published on Jul 17, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): DE VRIES, Sape (2487 Kaladar Avenue, Suite 209Ottawa, Ontario K1V 8B9)
Abstract:
A system and method of plasma separation and measurement in point-of-care diagnostic cartridges. ...