GENEVA, Feb. 3 -- HORIBA ADVANCED TECHNO CO., LTD. (2, Miyanohigashi-cho, Kisshoin, Minami-ku, Kyoto-shi, Kyoto6018551), 株式会社堀場アドバンスドテクノ (京都府京都市南区吉祥院宮の東町２番地) filed a patent application (PCT/JP2025/025443) for "MEASURING INSTRUMENT, MEASURING INSTRUMENT CONTROL METHOD, AND PROGRAM" on Jul 16, 2025. With publication no. WO/2026/023517, the details related to the patent application was published on Jan 29, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system,...