GENEVA, April 7 -- HORIBA, LTD. (2, Miyanohigashicho, Kisshoin, Minami-ku, Kyoto-shi, Kyoto6018510), 株式会社堀場製作所 (京都府京都市南区吉祥院宮の東町２番地) filed a patent application (PCT/JP2024/034558) for "X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM" on Sep 27, 2024. With publication no. WO/2025/070683, the details related to the patent application was published on Apr 03, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectu...