GENEVA, March 10 -- HORIBA, LTD. (2, Miyanohigashicho, Kisshoin, Minami-ku, Kyoto-shi, Kyoto6018510), 株式会社堀場製作所 (京都府京都市南区吉祥院宮の東町２番地) filed a patent application (PCT/JP2024/028237) for "SPECIMEN TESTING SYSTEM, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM" on Aug 07, 2024. With publication no. WO/2025/047353, the details related to the patent application was published on Mar 06, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organiza...