INTERNATIONAL PATENT: HONG KONG PRODUCTIVITY COUNCIL FILES APPLICATION FOR "AN ARTIFICIAL INTELLIGENCE (AI) -ENABLED REAL-TIME DEFECT DETECTION SYSTEM FOR ADDITIVE MANUFACTURING BASED ON MULTIMODAL DATA AND THE METHOD THEREOF"

GENEVA, Dec. 24 -- HONG KONG PRODUCTIVITY COUNCIL (HKPC Building78 Tat Chee AvenueKowloon, Hong Kong) filed a patent application (PCT/CN2025/108731) for "AN ARTIFICIAL INTELLIGENCE (AI) -ENABLED REAL-TIME DEFECT DETECTION SYSTEM FOR ADDITIVE MANUFACTURING BASED ON MULTIMODAL DATA AND THE METHOD THEREOF" on Jul 16, 2025. With publication no. WO/2025/256668, the details related to the patent application was published on Dec 18, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SHAN, Ming Yin (HKPC Building78 Tat Chee AvenueKowloon, Hong Kong), SHAN, Ao (HKPC Building78 Tat Chee AvenueKowloon, Ho...