INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "SPONTANEOUS MUTATION DETECTION METHOD, DEVICE, PROGRAM AND STORAGE MEDIUM"

GENEVA, Nov. 25 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/017897) for "SPONTANEOUS MUTATION DETECTION METHOD, DEVICE, PROGRAM, AND STORAGE MEDIUM" on May 16, 2025. With publication no. WO/2025/239452, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO)...