INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "SPECIMEN TESTING METHOD AND SPECIMEN TESTING SYSTEM"

GENEVA, July 8 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2023/046957) for "SPECIMEN TESTING METHOD AND SPECIMEN TESTING SYSTEM" on Dec 27, 2023. With publication no. WO/2025/141773, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): FUJIOKA ...