INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "SHAPE MEASUREMENT PROBE, THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD USING SAME AND NON-CONTACT OPTICAL MEASUREMENT DEVICE"

GENEVA, April 6 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/002281) for "SHAPE MEASUREMENT PROBE, THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD USING SAME, AND NON-CONTACT OPTICAL MEASUREMENT DEVICE" on Jan 25, 2024. With publication no. WO/2025/069466, the details related to the patent application was published on Apr 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the...